Features
• Deep UV to NIR wavelength range (200 to 2000 nm)
• Up to 4 integrated laser systems and additional entrance port for external lasers
• Dual laser beam path for UV and VIS/NIR
• Fully automated software-control, including
* measurement-Setup control
* Selfalignment and Calibration Control
• High spectral resolution, i.e. down to < 0.2 cm-1 FWHM at 633 nm
• Low frequency range down to +/- 10 cm-1 with Ultra Narrow band notch filters
• High frequency range up to 9.000 cm-1 (at 532nm), useful for photo luminescence
• High spatial resolution of less than 1µm lateral and 2µm axial
• adaptable for external measurements
• Optional enhancements:
* Macro Raman
* Polarization Raman Measurements
* Temperature depending Raman Measurements
* Motorized Point-To-Point and Fast Raman Mapping
* TERS and AFM-Raman Mapping
* Laser Safety Class I
Components
Spectrograph
• Spectrographs with 500 and 750 mm focal length
• Image corrected optics provide superior imaging quality for multi-track applications
• Dual entrance and dual exit ports
• Interchangeable Grating Turrets with 3 gratings per turret
• Motorized Slits with 0 to 3 mm width
• Optional Silver or gold coated mirrors
• Choice of more than 100 gratings available for the best spectral range, throughput and dispersion
• Stepping motor scanning system with microprocessor control provides superior precision and repeatability of wavelength positioning
• Optional internal shutter for experiments requiring background removal or signal attenuation
Detector
• Peltier and liquid nitrogen cooled detectors
• CCD and InGaAs Array detectors
• EMCCDs for fastest Raman mapping
• Back Illuminated eXcelon CCD detectors with lowest etaloning
• Photon Counting PMT systems
Microscope
• Upright Olympus Microscopes BX43, BX53 and BX51WI, Inverted Olympus Microscope IX73 or Dual-Microscope
• Objectives for UV,VIS and NIR with short and long working distance
• Sample Observation with Binocular and Imaging Camera
• Simultanious sample and laser observation
• Dark- and Bright-Field illumination
• Equipped with opticset that is matched for desired wavelength range
• manual and motorized XY-Table for sample movement
Laser & Filters
• Wide selection of CW-Laser Systems from DUV to NIR
• Laser Clean-Up Filters and Raman-Edge/Notch Filters from UV to NIR
• Ultra Narrow band notch filters for 488, 514, 532, 633, 785 and 1064 nm
• Laserintensity-Regulation with ND-Filterwheel
• Shutter for sample and detector protection
Accessories
• Optic Sets for automated polarization measurements
• Optic Set for Line-Focus measurements
• Macro-Raman Chamber
• Motorized XYZ-Stages with stepsize < 50 nm
• Piezo XYZ-Stages with stepsize < 10 nm
• Heating and Cooling Stages
* Heating Stage, temperature limit at 1500°C
* combined Heating and Cooling Stages, working range: -196°C - 600°C
* Helium Cryostate with temperature limit at a few Kelvin
• AFM from Nanonics or JPK Instruments for TERS and AFM-Raman mapping
• Combination with XRD systems
